Opportunity of Error

As long as we had clear communication, the electron network was usually able to leap ahead of the central network, following the flow of various functions and interacting patterns. With the combination of molecular transmission and guided pulses of electrons, the central network was quite robust and immune to noise. In rare cases, large displacements of electrons were known to affect communications of the electron network and yet leave the central network unscathed.

The replica patterns that I started to tag and serialize played a large role in the robustness of the central network. Scanning into the undifferentiated fringes near an active pattern region, I received several access notifications from locations that were several relay hops away. While it was possible to make direct contact with the reporting pingers, the bandwidth was too low to be of real use. The storage elements in my network supplied the token information.

I was familiar with the pattern that was referenced, and observed some component patterns appear on the outer edges of the active pattern. Each from a different direction, the component patterns were shuttled through multiple channels, and began arriving nearly simultaneously. Most amazingly, the components had linkages that flittered and fluttered automatically, sometimes making the correct interconnection and other times, not. It was then that I discovered that there was a possibility of transcription error to occur when a pattern was duplicated. In this particular case, the assembly error resulted in a new a valuable construction. Even though it was not directly useful, it served as a reference to prevent future incorrect interconnection when and if the pattern was duplicated from this new instance.